To capture the essence of your sample, you often need to analyze it with more than one method. Going from the micro to nano scale can require to correlate light with electron microscopy (CLEM), or X-ray with FIB-SEM (CXF). Correlative microscopy from ZEISS gives you integrated solutions and seamless workflows. Decide for ZEISS as the sole provider of light, electron, ion and X-Ray microscopes and profit from long years of experience in correlative analysis. Choose unique sample centric correlation of images and data to advance your work beyond the limiting boundaries of a single microscopy technique.
- Gain unique insights into your sample
- Move seamlessly from the micro to nano scale
- Acquire more data in less time with streamlined workflows
- Benefit from powerful image and data correlation handling
- Acquire, handle and analyze data from 2D to 4D
- Use correlative coverslips and holders for precise and efficient work
3D Imaging Systems
Your Guide to the Widest Selection of Optical Sectioning, Electron Microscopy and X-ray Microscopy Techniques.
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ZEISS Correlative Microscopy Solutions
A Publication Reference List
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Correlative Microscopy in Materials Science
Correlative microscopy is not a single technique but a varied collection of techniques that share a common approach. By applying several different icroscopy techniques to a single sample, scientists can study it at a much broader range of magnifications than is possible with a single technique. This allows them to conduct an initial low-magnification inspection of a sample to identify specific regions of interest (ROIs), which they can then zoom in on for a more detailed analysis, saving time and expense. There are other important advantages as well. Correlative microscopy allows scientists to study a greater diversity of samples, as some microscopy techniques work better with some materials than others, and to generate a much greater range of information about those samples at various different scales...
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