The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience that appeals to both trained microscopists and new users. With its comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.
SmartSEM Touch puts interactive workflow control directly at your fingertips. It is quick and easy to learn, dramatically reducing training effort and costs. Within minutes, even new users will begin capturing stunning images. This user interface also supports industrial operators who require automated workflows for repeatable inspection tasks.
EVO excels at extracting the maximum data quality from uncoated and unaltered samples. EVO also safeguards data quality on hydrated and heavily contaminated samples, by allowing these samples to remain in their native state. Additionally, the LaB6 emitter will give that extra bit of resolution, contrast and signal-to-noise that is important when imaging and microanalysis get challenging.
EVO can be configured to be part of a semi-automated multi-modal workflow, with tools for seamless relocation of regions of interest and integrity of data collected from multiple modalities. Combine light and electron microscope data for material characterization or parts inspection. Or combine EVO with ZEISS light microscopes for correlative particle analysis.
Depending on the actual laboratory environment, operation of the SEM can be the exclusive domain of expert electron microscopists. But this situation is challenged by the very common necessity that non-expert users, such as students, trainees, or quality engineers, also require data from the SEM. EVO takes both requirements into account, with user interface options that cater to the operational needs of experienced microscopists as well as non-micoscopists.
Expert users have access to advanced imaging parameters and analysis functions.
Novice users have access to predefined workflows and the most frequently used parameters – perfect for a beginner.
A camera can be mounted either to the chamber to monitor the position of the samples relative to the pole piece mounted backscattered detector (chamberscope); or on the vacuum chamber door (navigation camera) to enable a helicopter view of the arrangement of samples or parts on the sample holder. This view can then be used to set up predefined locations of interest identified from a light microscope image, and for easy navigation during the entire sample investigation process.
EVO enables automated, unattended acquisition of images across sample batches. ZEISS Automated Intelligent Imaging is perfectly suited to routine inspection. It enables the user to define a boundary region, automatically generate regions of interest determined by the required field of view or magnification, and begin automated acquisition. Automated Intelligent Imaging will improve your sample throughput, boosting productivity and performance.
Electron emission from a lanthanum hexaboride cathode, rather than a traditional tungsten hairpin filament, provides the reassurance that every extra bit of image quality is there when you need it. And that is a benefit you can put into action in two ways:
Catalyst particles imaged at high magnification and low kV (left: Tungsten, right: LaB6)
At challenging imaging conditions, LaB6 users benefit from up to 10 times more beam brightness, resulting in improved image resolution and contrast.
Shuttle & Find integrates EVO, compound light microscopes and digital microscopes into a correlative, multi-modal workflow
With ZEISS being the leading supplier of a wide range of microscopy and metrology systems, you can expect EVO to play extremely well with other ZEISS solutions.
With Shuttle & Find, the ZEISS hardware and software interface for correlative microscopy, you can establish a highly-productive multi-modal workflow between (digital) light microscopes and EVO. Combine the unique optical contrast methods of your light microscope with the equally unique imaging and analytical methods of SEM to obtain complementary data, and hence more meaningful information about the material, quality or failure mechanism of your sample.
Integrated Energy Dispersive Spectroscopy Solution
EVO can be configured with the integrated EDS system, EVO Element. The integration improves usability by using only one PC to control both the EDS and the SEM. At the same time, parallel control is possible by having dedicated user interfaces for microscope and EDS control.
The EVO Element EDS solution is the integrated choice, with a price advantage due to this integration of components, and synergies in after-sales service and support.
| ZEISS EVO 10 | ZEISS EVO 15 | ZEISS EVO 25 | |
|---|---|---|---|
| Choose EVO 10—with optional backscatter detector and Element EDS system—to be your entry point to scanning electron microscopy, at a remarkably affordable price. Even this smallest of EVO vacuum chambers is well differentiated from tabletop SEMs. Your investment in EVO now assures that you are ready for applications that require more space and ports than you anticipate today. | EVO 15 demonstrates the flexibility concept of the EVO family and excels in analytical applications. Opt for the larger vacuum chamber of the EVO 15, and add variable pressure for imaging and analysis of non-conductive samples or parts, and you have a versatile, multi-purpose solution for central microscopy facilities or industrial quality assurance laboratories. | EVO 25 is the industrial workhorse solution with enough space to accommodate even the largest parts and assemblies. Expand EVO 25 capabilities further with an optional 80 mm Z travel stage that can handle weights up to 2 kg even with tilt. Additionally, the large chamber will accommodate multiple analytical detectors for the most demanding microanalysis applications. | |
| Maximum specimen heights | 100 mm | 135 mm | 210 mm |
| Maximum specimen diameter | 200 mm | 250 mm | 300 mm |
| Motorized stage travel XYZ | 80 x 100 x 35 mm | 125 x 125 x 50 mm | 130 x 130 x 50 (or 80) mm |
| High Vacuum (HV) mode Best quality imaging and analysis on conductive samples |
|
|
|
| Variable Pressure (VP) mode High quality imaging and analysis on uncoated, non-conductive samples |
|
|
|
| Extended Pressure (EP) mode Environmental imaging of hydrated or contaminated samples in their natural state |
|
|
|
Surface of titanium alloy (Ti-6Al-4V) additively manufactured using selective laser melting showing fully melted regions alongside unmelted Ti-6Al-4V particles and other material.
Expansion and crack bridging network of self-healing minerals, imaged using SE detector at 12 kV shows flower-like hydro-magnesite structures is formed.
Your High Definition SEM with Workflow Automation
ページ: 34
ファイルサイズ: 12.071 kB
Receive high quality images with enhanced surface contrast and topographical detail for low kV imaging and life science samples
ページ: 6
ファイルサイズ: 845 kB
ページ: 7
ファイルサイズ: 5.371 kB
ページ: 6
ファイルサイズ: 5.021 kB
ページ: 7
ファイルサイズ: 3.915 kB
Use the largest field of view yet devised for SEM for easy navigation across large specimens
ページ: 6
ファイルサイズ: 591 kB
Multi-modal characterization and advanced analysis options for industry and research
ページ: 22
ファイルサイズ: 12.414 kB
By Combining Light and Scanning Electron Microscopy in a Correlative Workflow
ページ: 8
ファイルサイズ: 1.456 kB
ページ: 5
ファイルサイズ: 1.975 kB
ページ: 4
ファイルサイズ: 952 kB
