Workpieces are getting smaller, manufacturing tools are able to produce impressively small features with very ambitious tolerances. To assure quality, you have to measure features too small for the human eye to see.
NEO pixel brings metrology functionalities to microscopy – giving you higher quality and better productivity.
- Create measurement plans based on example workpieces, using automatic feature detection.
- Perform predefined measurement tasks automatically and user-independently.
- Compare your measurements with CAD data to check for deviations.
- Generate reports with ZEISS PiWeb.
- Export data for further analysis.
- Share inspection plans and results with colleagues in other labs.
- Use NEO pixel with all ZEISS microscopes.