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日本顕微鏡学会 第81回学術講演会へ参加
ZEISS顕微鏡先進技術のご紹介
日本顕微鏡学会
第81回学術講演会
開催概要
|
会期 |
2025年6月9日（月）～11日（水） |
|---|---|
|
会場 |
福岡国際会議場 MAP |
|
参加登録 |
学術講演会ウェブサイトをご確認ください |
ZEISSブース、セミナー
ZEISS プレゼンテーションスケジュールPDF を下記よりダウンロードいただけます
光学・電子・Ｘ線顕微鏡による解析ソリューション
全日程 / 2F 多目的ホール E
企業展示では、マテリアルサイエンス分野はもちろん、ライフサイエンス分野における、SEM, XRMの活用事例もご紹介いたします。
特に、新製品である ZEISS Crossbeam 550 Samplefab は、透過電子顕微鏡（TEM）用試料（ラメラ）の全自動作製に特化した集束イオンビーム走査電子顕微鏡（FIB-SEM）であり、半導体デバイスの欠陥解析とプロセス歩留まり向上に不可欠な高品質TEMラメラの正確かつ再現性の高い作製を実現します。
＜電子顕微鏡ソリューション＞
・【新製品】 ZEISS Crossbeam 550 Samplefab
・電池材料解析ソリューション
・集束イオンビーム走査電子顕微鏡 ZEISS Crossbeamシリーズ
＜X線顕微鏡ソリューション＞
・【新製品】VersaXRM 730
・大型資料を高分解能で観察できる ZEISS 独のRaaDテクノロジー
・パッケージ開発と故障解析を加速する3次元X線顕微鏡のためのAI技術
＜ライフサイエンスソリューション＞
・細胞の微細構造を3次元で捉える ZEISS Volutome
・ライフサイエンス向け ZEISS VersaXRMソリューション
落下時にボダイジュ（Tilia miqueliana）の種が回転するために重要な構造について
6月9日（月） 15:00 - 15:15 / C会場 5F 502/503
前田 将輝様（拓殖大学）、井阪 琢真
高分解能汎用CT ZEISS VersaXRM: 半自動ワークフローによる非破壊微細構造イメージング
6月9日（月）17:30 - 18:00 / C会場 5F 502/503
佐藤 朗、山本 千智
各種顕微鏡オペレーションと画像データ解析におけるネットワーク応用の可能性
6月10日（火） 9:45 - 10:15 / A会場 3F メインホール
佐藤 朗
ZEISS電子顕微鏡:FE-SEMとFIB-SEMによる先駆的な研究革新 ～ユーザーフレンドリーな高性能電子顕微鏡で3D視点から材料を理解する～
6月10日（火） 12:00 - 12:50 / B会場 ５F 501
佐藤 朗、小幡 卓眞、孫 カイイン
ランチボックス引換券は、当日8時より1F配布所にて配布いたします
走査イオン顕微鏡によるNd-Fe-B焼結磁石の磁区コントラスト観察
6月11日（水） 15:45 - 16:00 / D会場 ４F 411/412
名越 正泰、 佐藤 馨（JFEテクノリサーチ株式会社）、小田 武秀
ダイヤモンドを夢見るカーボンの旅
6月10日（火） 9:00 - 17:30, 6月11日（水）10:00 - 17:30 / 2Fロビー
小田 武秀、孫 カイイン
ZEISS Microscopy Solutions
![]({"xsmall":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/gemini-3-560.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/gemini-3-560.jpg","small":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/gemini-3-560.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/gemini-3-560.jpg","medium":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/gemini-3-560.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/gemini-3-560.jpg","large":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/gemini-3-560.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/gemini-3-560.jpg","xlarge":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/gemini-3-560.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/gemini-3-560.jpg","xxlarge":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/gemini-3-560.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/gemini-3-560.jpg","max":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/gemini-3-560.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/gemini-3-560.jpg"})
ZEISS GeminiSEM
極低加速フィールドエミッション走査型電子顕微鏡（FE-SEM）
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ZEISS Sigma
汎用フィールドエミッション走査型電子顕微鏡（FE-SEM）
![]({"xsmall":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"})
ZEISS Crossbeam
集束イオンビーム加工観察装置（FIB-SEM）
![]({"xsmall":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.100.100.file/versaxrm_730_zen-navx.jpg","small":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.360.360.file/versaxrm_730_zen-navx.jpg","medium":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.768.768.file/versaxrm_730_zen-navx.jpg","large":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original./versaxrm_730_zen-navx.jpg","xlarge":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original./versaxrm_730_zen-navx.jpg","xxlarge":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original./versaxrm_730_zen-navx.jpg","max":"https://www.zeiss.co.jp/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original./versaxrm_730_zen-navx.jpg"})